6 results
Atomic-Resolution Imaging of Graphene Using an Ultrahigh-vacuum Microscope with a High-brightness Electron Gun
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2358-2359
- Print publication:
- August 2020
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Performance of Low-kV Aberration-corrected STEM with Delta-corrector and CFEG in Ultrahigh Vacuum Environment
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 468-469
- Print publication:
- July 2017
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Ultra High Energy Resolution EELS Mapping using Aberration-corrected Low-voltage STEM Equipped with Monochromator
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 962-963
- Print publication:
- July 2016
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Improvement of TEM Spatial Resolution at Low Accelerating Voltages (15-30 kV) with Monochromator
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 982-983
- Print publication:
- July 2016
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Development of a Monochromated and Aberration-Corrected Low-Voltage (S)TEM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 351-352
- Print publication:
- August 2015
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TEM studies on twin boundary in YBa2Cu3O7 and YBa2(Cu0.98M0.02)3O7 (M = Zn, Al)
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- Journal:
- Journal of Materials Research / Volume 5 / Issue 7 / July 1990
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1380-1387
- Print publication:
- July 1990
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